V. Turchanikov : rechercher sur Z-Library

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1

Charge storage peculiarities in poly-Si–SiO2–Si memory devices with Si nanocrystals rich SiO2

V.I. Turchanikov, A.N. Nazarov, V.S. Lysenko, Josep Carreras, B. Garrido

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 203 KB

english, 2005

2

Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation

V. Turchanikov, A. Nazarov, V. Lysenko, V. Ostahov, O. Winkler, B. Spangenberg, H. Kurz

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 783 KB

english, 2007

3

Transformation of SiSiO2Al structures under RF-plasma treatment

V.S. Lysenko, A.N. Nazarov, I.N. Osiyuk, V.I. Turchanikov

Journal:

Applied Surface Science

Année:

1989

Langue:

english

Fichier:

PDF, 180 KB

english, 1989

4

Study of the unipolar bias recharging phenomenon in the nonvolatile memory cells containing silicon nanodots

V.I. Turchanikov, A.N. Nazarov, V.S. Lysenko, O. Winkler, B. Spangenberg, H. Kurz

Journal:

Materials Science and Engineering: B

Année:

2005

Langue:

english

Fichier:

PDF, 271 KB

english, 2005

5

Charging/discharging kinetics in LPCVD silicon nanocrystal MOS memory structures

V. Turchanikov, A. Nazarov, V. Lysenko, E. Tsoi, A. Salonidou, A.G. Nassiopoulou

Journal:

Physica E: Low-dimensional Systems and Nanostructures

Année:

2007

Langue:

english

Fichier:

PDF, 638 KB

english, 2007

6

Effect of bombardment with low-energy Ar+ ions on electron scattering in accumulation layers of n-Ge

Yu. I. Gorkun, V. L. Korobanov, V. S. Lysenko, V. A. Novominskii, V. I. Turchanikov

Journal:

physica status solidi (a)

Année:

1977

Langue:

english

Fichier:

PDF, 462 KB

english, 1977

7

Isothermal DLTS method using sampling time scanning

V. I. Turchanikov, V. S. Lysenko, V. A. Gusev

Journal:

physica status solidi (a)

Année:

1986

Langue:

english

Fichier:

PDF, 393 KB

english, 1986

8

Modelling of radiation-induced charge trapping at the Si*SiO2 interface of MOS structures

Yu. D. Tkachev, V. S. Lysenko, V. I. Turchanikov

Journal:

physica status solidi (a)

Année:

1993

Langue:

english

Fichier:

PDF, 508 KB

english, 1993

9

Charge trapping processes at memory window formation in single- and double nanocrystal layered NVMs

Ievtukh, V., Nazarov, A., Turchanikov, V., Lysenko, V., Nassiopoulou, A.

Journal:

Microelectronic Engineering

Année:

2013

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2013

10

The comparative effects of injury and amyloid injection on Alzheimer antigens in the rat brain

Ievtukh, V., Nazarov, A., Turchanikov, V., Lysenko, V., Nassiopoulou, A.

Journal:

Neurobiology of Aging

Année:

1992

Langue:

english

Fichier:

PDF, 180 KB

english, 1992

11

Carrier transport in amorphous SiC/crystalline silicon heterojunctions

Nazarov, A. N., Vovk, Ya. N., Lysenko, V. S., Turchanikov, V. I., Scryshevskii, V. A., Ashok, S.

Journal:

Journal of Applied Physics

Année:

2001

Langue:

english

Fichier:

PDF, 370 KB

english, 2001

12

[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Comparative studies of single- and double-nanocrystal layer NVM structures: Charge accumulation and retention

Turchanikov, V., Ievtukh, V., Nazarov, A., Lysenko, V., Theodoropoulou, M., Nassiopoulou, A. G.

Année:

2010

Langue:

english

Fichier:

PDF, 299 KB

english, 2010

13

Nanocluster NVM Cells Metrology: Window Formation, Relaxation and Charge Retention Measurements

Ievtukh, V.A., Nazarov, A.N., Turchanikov, V.I., Lysenko, V.S.

Journal:

Advanced Materials Research

Année:

2013

Langue:

english

Fichier:

PDF, 2.31 MB

english, 2013

14

[IEEE EUROCON 2005 - The International Conference on "Computer as a Tool" - Belgrade, Serbia and Montenegro (2005.11.21-2005.11.24)] EUROCON 2005 - The International Conference on "Computer as a Tool" - Computer as a Tool for Nanocluster NVM Cells Diagnostics

Turchanikov, V., Nazarov, A., Lysenko, V., Winkler, O., Spangenberg, B., Kurz, H.

Année:

2005

Langue:

english

Fichier:

PDF, 2.15 MB

english, 2005

15

Charge trapping in Si-implanted SiO 2 -Si memory devices at high electric fields and elevated temperatures

Turchanikov, V I, Nazarov, A N, Lysenko, V S, Carreras, J, Garrido, B

Journal:

Journal of Physics Conference Series

Année:

2005

Langue:

english

Fichier:

PDF, 249 KB

english, 2005

16

ChemInform Abstract: ELECTRONIC SPECTRA OF RADICAL CATIONS. INDENE HETEROANALOGS

PETRUSHENKO, K. B., TURCHANIKOV, V. K., VOKIN, A. I., ERMIKOV, A. F., FROLOV, YU. L.

Journal:

Chemischer Informationsdienst

Année:

1985

Fichier:

PDF, 90 KB

1985